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Nanometrics (NASDAQ:NANO) Director Bruce C. Rhine sold 2,500 shares of the stock in a transaction dated Thursday, June 26th. The shares were sold at an average price of $17.75, for a total transaction of $44,375.00. Following the sale, the director now directly owns 840,613 shares in the company, valued at approximately $14,920,881. The transaction was disclosed in a document filed with the Securities & Exchange Commission, which is available at this link.

Nanometrics (NASDAQ:NANO) traded down 0.60% on Monday, hitting $18.26. 2,774 shares of the company’s stock traded hands. Nanometrics has a 52-week low of $13.37 and a 52-week high of $19.94. The stock has a 50-day moving average of $17.05 and a 200-day moving average of $17.62. The company’s market cap is $436.3 million.

Nanometrics (NASDAQ:NANO) last released its earnings data on Tuesday, April 29th. The company reported $0.09 earnings per share (EPS) for the quarter, beating the consensus estimate of $0.08 by $0.01. The company had revenue of $51.60 million for the quarter, compared to the consensus estimate of $51.15 million. During the same quarter in the previous year, the company posted ($0.22) earnings per share. The company’s revenue for the quarter was up 109.8% on a year-over-year basis. On average, analysts predict that Nanometrics will post $0.37 earnings per share for the current fiscal year.

A number of research firms have recently commented on NANO. Analysts at DA Davidson cut their price target on shares of Nanometrics from $18.00 to $17.00 in a research note on Wednesday, April 30th. Analysts at Canaccord Genuity cut their price target on shares of Nanometrics from $20.00 to $18.00 in a research note on Wednesday, April 30th. They now have a “buy” rating on the stock. Four investment analysts have rated the stock with a hold rating and two have issued a buy rating to the company. The company presently has a consensus rating of “Hold” and an average target price of $19.03.

Nanometrics Incorporated (NASDAQ:NANO) is a provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of integrated circuits, high-brightness (HB) light emitting diodes (LEDs), data storage devices and solar photovoltaics (solar PV).

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