Insider Selling: Bruce C. Rhine Sells 2,500 Shares of Nanometrics Stock (NANO)
Nanometrics (NASDAQ:NANO) Director Bruce C. Rhine sold 2,500 shares of Nanometrics stock on the open market in a transaction that occurred on Thursday, June 26th. The stock was sold at an average price of $17.75, for a total value of $44,375.00. Following the sale, the director now directly owns 840,613 shares of the company’s stock, valued at approximately $14,920,881. The sale was disclosed in a filing with the Securities & Exchange Commission, which is available at this link.
Nanometrics (NASDAQ:NANO) opened at 18.25 on Tuesday. Nanometrics has a 1-year low of $13.37 and a 1-year high of $19.94. The stock’s 50-day moving average is $17.12 and its 200-day moving average is $17.62. The company’s market cap is $436.1 million.
Nanometrics (NASDAQ:NANO) last announced its earnings results on Tuesday, April 29th. The company reported $0.09 EPS for the quarter, beating the Thomson Reuters consensus estimate of $0.08 by $0.01. The company had revenue of $51.60 million for the quarter, compared to the consensus estimate of $51.15 million. During the same quarter in the prior year, the company posted ($0.22) earnings per share. The company’s quarterly revenue was up 109.8% on a year-over-year basis. On average, analysts predict that Nanometrics will post $0.37 earnings per share for the current fiscal year.
A number of analysts have recently weighed in on NANO shares. Analysts at DA Davidson cut their price target on shares of Nanometrics from $18.00 to $17.00 in a research note on Wednesday, April 30th. Analysts at Canaccord Genuity cut their price target on shares of Nanometrics from $20.00 to $18.00 in a research note on Wednesday, April 30th. They now have a “buy” rating on the stock. Four investment analysts have rated the stock with a hold rating and two have assigned a buy rating to the stock. The company currently has a consensus rating of “Hold” and a consensus target price of $19.03.
Nanometrics Incorporated (NASDAQ:NANO) is a provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of integrated circuits, high-brightness (HB) light emitting diodes (LEDs), data storage devices and solar photovoltaics (solar PV).
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