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Nanometrics (NASDAQ:NANO) CEO Timothy J. Stultz sold 7,166 shares of the stock in a transaction that occurred on Tuesday, July 1st. The stock was sold at an average price of $18.65, for a total transaction of $133,645.90. Following the transaction, the chief executive officer now directly owns 202,762 shares of the company’s stock, valued at approximately $3,781,511. The sale was disclosed in a filing with the Securities & Exchange Commission, which is available at this link.

Nanometrics (NASDAQ:NANO) traded up 1.92% during mid-day trading on Tuesday, hitting $18.60. The stock had a trading volume of 161,686 shares. Nanometrics has a 52 week low of $13.37 and a 52 week high of $19.94. The stock’s 50-day moving average is $17.1 and its 200-day moving average is $17.. The company’s market cap is $444.5 million.

Nanometrics (NASDAQ:NANO) last announced its earnings results on Tuesday, April 29th. The company reported $0.09 EPS for the quarter, beating the Thomson Reuters consensus estimate of $0.08 by $0.01. The company had revenue of $51.60 million for the quarter, compared to the consensus estimate of $51.15 million. During the same quarter in the prior year, the company posted ($0.22) earnings per share. The company’s quarterly revenue was up 109.8% on a year-over-year basis. Analysts expect that Nanometrics will post $0.37 EPS for the current fiscal year.

Several analysts have recently commented on the stock. Analysts at DA Davidson cut their price target on shares of Nanometrics from $18.00 to $17.00 in a research note on Wednesday, April 30th. Analysts at Canaccord Genuity cut their price target on shares of Nanometrics from $20.00 to $18.00 in a research note on Wednesday, April 30th. They now have a “buy” rating on the stock. Four analysts have rated the stock with a hold rating and two have assigned a buy rating to the company. Nanometrics presently has an average rating of “Hold” and an average target price of $19.03.

Nanometrics Incorporated (NASDAQ:NANO) is a provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of integrated circuits, high-brightness (HB) light emitting diodes (LEDs), data storage devices and solar photovoltaics (solar PV).

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